X- and γ- Rays

X-Ray Crystallography

The X-Ray Crystallography facility at DiSC includes wide angle X-ray diffraction (WAXD) (reflection and transmission geometry) with temperature control and small angle X-ray scattering (SAXS). Sophisticated computer software is dedicated to the elaboration and study of the acquired diffractograms to determine structural and morphological parameters in inorganic and organic materials as crystalline structure, dimensions of crystallites, crystallinity degree, in addition it is possible to study lamellar morphology in polymer materials.
A senior technical assistant is dedicated to the maintenance of the instruments, both for students training and for support to the collaborations with researchers.

Diffractometers housed at DiSC are:

Philips Small Angle X-rays Scattering (SAXS) Diffractometer

The Philips Small Angle diffractometer housed at DiSC is equipped with the Hecus X-Ray Camera and a temperature control unit up to 300°C. The system allows to collect diffractograms from 0 to 2° in terms of 2θ angles, thus allowing for the study of ordered structures in the range from 10 to 1000 Å.

location at DiSC: 215-01-082


Ital Structures GT 2000 Wide Angle X-rays Scattering (WAXS) Transmission Diffractometer

The Ital Structure GT2000 WAXS allows to collect diffraction patterns from 2° to 60° 2θ in transmission geometry. The system is actually dedicated to the study of polymer powders, films and fibers in order to determine crystal structure and crystallinity degree.

location at DiSC: 215-01-083


Philips X'Pert Pro Wide Angle X-rays Scattering (WAXS) Diffractometer


The Philips X'Pert Pro WAXS housed at DiSC collects X-ray diffraction patterns in traditional reflection geometry and in grazing angle configuration. The instrument is equipped with a liquid nitrogen temperature control unit in a range extending from -40°C to 300°C. Beside the structural study the equipment is particularly suitable for the analysis of surface and surface modifications.

location at DiSC: 215-01-083


contacts about the SAXS and the two WAXSes:

Bruker D8 Advance Diffractometer


Equipped with a Göbel mirror and a CuKα X-ray source, it can be operated in a traditional Bragg-Brentano (θ-2θ) geometry or in a glancing incidence configuration, allowing thus the structural analysis of powder materials as well as of surfaces and thin films.


location at DiSC: 215-01-063

γ-Ray Spectroscopy

γ-Ray Spectroscopy facility of DiSC is:


Mössbauer Spectroscopy


57Fe Mössbauer spectroscopy is a nuclear technique that can be used to provide a very precise information about the chemical, structural, magnetic and time-dependent properties of a material. The instrumental set up at DISC allows the investigation both on bulk and on surface. The former can be obtained by the classic transmission spectroscopy while the latter by using a backscattering spectrometer directly projected and constructed in the DiSC.

This facility is used for the investigation of iron and tin containing samples of Cultural Heritage Artefacts.

location at DiSC: 215-00-059